Socionext will present at 2025 ESD AND RELIABILITY SYMPOSIUM
Socionext will present at 2025 ESD AND RELIABILITY SYMPOSIUM from October 21 to 22, 2025.
At this symposium, Socionext will present its efforts and achievements in ESD verification of 2.5D/3D-IC, as well as the latch-up measurement system developed jointly with Hanwa Electronic Ind. Co., Ltd.
Event Information
Title | 2025 ESD AND RELIABILITY SYMPOSIUM(Japanese version only) |
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Period | Tuesday, October 21 to Wednesday, October 22, 2025 |
Venue | Ota City Industrial Plaza, PiO (Ota-ku, Tokyo) |
Organizer | Reliability Center for Electronic Components of Japan |
Socionext Presentation
●Session : 35E-06 Devices, Measurements, ESD Verification
Date/Time | Tuesday, October 21, 2025 15:45 to 16:10 (JST) |
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Venue | 4F Convention Hall-A |
Title | Novel Methodology to Address ESD Verification Complexity of 2.5D/3D-IC Design *Japanese presentation only |
Speakers | Hirotaka Yamazaki/ Engineer, Kazuya Okubo/ Engineer, Teruo Suzuki/ Principal Engineer Technology Development Division, Development Group, Socionext Inc. |
●Session : 35E-08 Devices, Measurements, ESD Verification
Date/Time | Tuesday, October 21, 2025 16:45 to 17:10 (JST) |
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Venue | 4F Convention Hall-A |
Title | Development of a New Latch-Up Measurement System for Advanced LSIs *Joint presentation with Hanwa Electronic Ind. Co., Ltd. *Japanese presentation only |
Speakers | Kazuya Okubo/ Engineer, Hirotaka Yamazaki/ Engineer, Teruo Suzuki/ Principal Engineer Technology Development Division, Development Group, Socionext Inc. |